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Electron source power supply ES40-PS

Allows fine adjustment of electron beam energy, density, position on the sample and also beam profile

SKU: 72 Category:


[vc_row][vc_column][vc_column_text]Scanning features allows for independently controlled scanning speed and range. All settings can be manually adjusted or can be stored and recalled automatically after unit switch on. The unit also features a built in timer and automatic standby mode. The ES40-PS can be supplied as a full width 19″ rack mounting unit (3U height) or free standing. Easy firmware update via USB port. Unit can be remotely controlled via RS232/485 or Ethernet interfaces. Autosave function for saving your parameters/unit preset and applying them automatically after restart.[/vc_column_text][/vc_column][/vc_row]

Technical data

Supply voltage 100 – 120 VAC/200 – 240 VAC, 50-60 Hz (power consumption max 250 W)
Beam energy 0 – 5000 eV, resolution 0.1 eV, ripple < 200 mV
Emission current 0.1 – 300 μA, res. 0.01 μA [ES mode]
1 – 3000 nA, res. 1 nA [CMA mode]
Focus Voltage 60 – 100 % related to energy voltage, resolution 0.1 %
Wehnelt voltage 0 – 150 V, res. 0.1 V [ES mode]
-12 – 12 V, res. 0.1 V [CMA mode]
Beam position (Px,Py) resolution 0.01 mm, middle pos ±5 mm
Scanning area (Δx, Δy) 10 mm × 10 mm, resolution 0.01 mm
Scanning speed (time/dot) 20 μs – 30 ms
Timer dual mode timer 0s – 99h 59m
Vacuum measurement (optional) CTR90, TTR91, TTR211, PTR225, PTR90, ITR90, ITR100, Baratron, ANALOG IN, MKS937A, PG105, MG13/14, PKR251/360/361, PCR280, ATMION
Communication interface RS232/485, Ethernet
Communication protocol MODBUS-TCP
User interface 7″ TFT display with touchscreen, digital encoder
Interface languages English, German, Polish
Dimensions 483 x 133 x 435 mm (W x H x D), 19″ rack mountable
Weight (approx.) 9.2 kg


The ES40-PS power supply is intended to use with the ES40C1 Low Energy Electron Source or Double Pass Mini Cylindrical Mirror Analyzer CMA 40CF. The power supply allows fine adjustment of the electron beam profile to achieve a small spot at high energy and emission currents.


– Software control (Version Pro, Extended or Library Module),
– Analog I/O card for vacuum measurement (1 gauge).

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