Compact, easy-to-use extractor-type ion source with a beam-focusing function. It is mainly used for sample surface cleaning, but the focus feature enables more possibilities. For example: it allows to cover different sample areas at the same sample distance or to use source even when it’s impossible to get the source closer to the sample. The source generates an ion current of >200 μA/cm2 (Argon) with a Gaussian beam profile. The ion gun insertion length is adaptable to individual requirements (between 143 mm – 386 mm, other on request).